Pattern Recognition Based on Relative Position of Local Features Using Self-Organizing Map

Keiichi Horio, Akira Aikawa, Takeshi Yamakawa. Pattern Recognition Based on Relative Position of Local Features Using Self-Organizing Map. In First International Conference on Innovative Computing, Information and Control (ICICIC 2006), 30 August - 1 September 2006, Beijing, China. pages 293-296, IEEE Computer Society, 2006. [doi]

Authors

Keiichi Horio

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Akira Aikawa

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Takeshi Yamakawa

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