Keiichi Horio, Akira Aikawa, Takeshi Yamakawa. Pattern Recognition Based on Relative Position of Local Features Using Self-Organizing Map. In First International Conference on Innovative Computing, Information and Control (ICICIC 2006), 30 August - 1 September 2006, Beijing, China. pages 293-296, IEEE Computer Society, 2006. [doi]
Abstract is missing.