Ray-Hua Horng, Re-Ching Lin, Yi-Chen Chiang, Bing-Han Chuang, Hung-Lieh Hu, Chen-Peng Hsu. Failure modes and effects analysis for high-power GaN-based light-emitting diodes package technology. Microelectronics Reliability, 52(5):818-821, 2012. [doi]
Abstract is missing.