Microelectronic Device Electrical Test Implementation Problems on Automated Test Equipment

Willis J. Horth, Frederick G. Hall, Robert G. Hillman. Microelectronic Device Electrical Test Implementation Problems on Automated Test Equipment. In Proceedings International Test Conference 1982, Philadelphia, PA, USA, November 1982. pages 299-307, IEEE Computer Society, 1982.

Authors

Willis J. Horth

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Frederick G. Hall

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Robert G. Hillman

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