Toshinori Hosokawa, Tomoo Inoue, Toshihiro Hiraoka, Hideo Fujiwara. Test sequence compaction methods for acyclic sequential circuits using a time expansion model. Systems and Computers in Japan, 33(10):105-115, 2002. [doi]
@article{HosokawaIHF02,
title = {Test sequence compaction methods for acyclic sequential circuits using a time expansion model},
author = {Toshinori Hosokawa and Tomoo Inoue and Toshihiro Hiraoka and Hideo Fujiwara},
year = {2002},
doi = {10.1002/scj.1162},
url = {http://dx.doi.org/10.1002/scj.1162},
tags = {testing},
researchr = {https://researchr.org/publication/HosokawaIHF02},
cites = {0},
citedby = {0},
journal = {Systems and Computers in Japan},
volume = {33},
number = {10},
pages = {105-115},
}