Test sequence compaction methods for acyclic sequential circuits using a time expansion model

Toshinori Hosokawa, Tomoo Inoue, Toshihiro Hiraoka, Hideo Fujiwara. Test sequence compaction methods for acyclic sequential circuits using a time expansion model. Systems and Computers in Japan, 33(10):105-115, 2002. [doi]

Abstract

Abstract is missing.