Toshinori Hosokawa, Momona Mizota, Masayoshi Yoshimura, Masayuki Arai. A Low Power Oriented Multiple Target Test Generation Method for 2-Cycle Gate-Exhaustive Faults. In IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2024, Didcot, United Kingdom, October 8-10, 2024. pages 1-6, IEEE, 2024. [doi]
Abstract is missing.