A concurrent testing method for NoC switches

Mohammad Hosseinabady, Abbas Banaiyan, Mahdi Nazm Bojnordi, Zainalabedin Navabi. A concurrent testing method for NoC switches. In Georges G. E. Gielen, editor, Proceedings of the Conference on Design, Automation and Test in Europe, DATE 2006, Munich, Germany, March 6-10, 2006. pages 1171-1176, European Design and Automation Association, Leuven, Belgium, 2006. [doi]

Abstract

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