Chih-Sheng Hou, Yong-Xiao Chen, Jin-Fu Li, Chih-Yen Lo, Ding-Ming Kwai, Yung-Fa Chou. A built-in self-repair scheme for DRAMs with spare rows, columns, and bits. In 2016 IEEE International Test Conference, ITC 2016, Fort Worth, TX, USA, November 15-17, 2016. pages 1-7, IEEE, 2016. [doi]
Abstract is missing.