Chih-Sheng Hou, Jin-Fu Li. Allocation of RAM built-in self-repair circuits for SOC dies of 3D ICs. In 31st IEEE VLSI Test Symposium, VTS 2013, Berkeley, CA, USA, April 29 - May 2, 2013. pages 1-6, IEEE Computer Society, 2013. [doi]
@inproceedings{HouL13,
title = {Allocation of RAM built-in self-repair circuits for SOC dies of 3D ICs},
author = {Chih-Sheng Hou and Jin-Fu Li},
year = {2013},
doi = {10.1109/VTS.2013.6548940},
url = {http://doi.ieeecomputersociety.org/10.1109/VTS.2013.6548940},
researchr = {https://researchr.org/publication/HouL13},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {31st IEEE VLSI Test Symposium, VTS 2013, Berkeley, CA, USA, April 29 - May 2, 2013},
publisher = {IEEE Computer Society},
isbn = {978-1-4673-5542-1},
}