Po-Fan Hou, Yi-Tsung Lin, Jiun-Lang Huang, Ann Shih, Zoe F. Conroy. An IR-Drop Aware Test Pattern Generator for Scan-Based At-Speed Testing. In 25th IEEE Asian Test Symposium, ATS 2016, Hiroshima, Japan, November 21-24, 2016. pages 167-172, IEEE Computer Society, 2016. [doi]
@inproceedings{HouLHSC16,
title = {An IR-Drop Aware Test Pattern Generator for Scan-Based At-Speed Testing},
author = {Po-Fan Hou and Yi-Tsung Lin and Jiun-Lang Huang and Ann Shih and Zoe F. Conroy},
year = {2016},
doi = {10.1109/ATS.2016.23},
url = {http://doi.ieeecomputersociety.org/10.1109/ATS.2016.23},
researchr = {https://researchr.org/publication/HouLHSC16},
cites = {0},
citedby = {0},
pages = {167-172},
booktitle = {25th IEEE Asian Test Symposium, ATS 2016, Hiroshima, Japan, November 21-24, 2016},
publisher = {IEEE Computer Society},
isbn = {978-1-5090-3809-1},
}