Po-Fan Hou, Yi-Tsung Lin, Jiun-Lang Huang, Ann Shih, Zoe F. Conroy. An IR-Drop Aware Test Pattern Generator for Scan-Based At-Speed Testing. In 25th IEEE Asian Test Symposium, ATS 2016, Hiroshima, Japan, November 21-24, 2016. pages 167-172, IEEE Computer Society, 2016. [doi]
Abstract is missing.