Nicolas Houarche, Mariane Comte, Michel Renovell, Alejandro Czutro, Piet Engelke, Ilia Polian, Bernd Becker. An Electrical Model for the Fault Simulation of Small Delay Faults Caused by Crosstalk Aggravated Resistive Short Defects. In 27th IEEE VLSI Test Symposium, VTS 2009, May 3-7, 2009, Santa Cruz, California, USA. pages 21-26, IEEE Computer Society, 2009. [doi]
@inproceedings{HouarcheCRCEPB09,
title = {An Electrical Model for the Fault Simulation of Small Delay Faults Caused by Crosstalk Aggravated Resistive Short Defects},
author = {Nicolas Houarche and Mariane Comte and Michel Renovell and Alejandro Czutro and Piet Engelke and Ilia Polian and Bernd Becker},
year = {2009},
doi = {10.1109/VTS.2009.57},
url = {http://dx.doi.org/10.1109/VTS.2009.57},
researchr = {https://researchr.org/publication/HouarcheCRCEPB09},
cites = {0},
citedby = {0},
pages = {21-26},
booktitle = {27th IEEE VLSI Test Symposium, VTS 2009, May 3-7, 2009, Santa Cruz, California, USA},
publisher = {IEEE Computer Society},
isbn = {978-0-7695-3598-2},
}