Nesrine Houhat, Sébastien Ménigot, Tarek Boutkedjirt, Redouane Drai, Jean-Marc Girault. Optimal Stochastic Excitation for Linear Flaw Detection in a Solid Material. In Rubén Vera-Rodríguez, Julian Fiérrez, Aythami Morales, editors, Progress in Pattern Recognition, Image Analysis, Computer Vision, and Applications - 23rd Iberoamerican Congress, CIARP 2018, Madrid, Spain, November 19-22, 2018, Proceedings. Volume 11401 of Lecture Notes in Computer Science, pages 229-236, Springer, 2018. [doi]
@inproceedings{HouhatMBDG18,
title = {Optimal Stochastic Excitation for Linear Flaw Detection in a Solid Material},
author = {Nesrine Houhat and Sébastien Ménigot and Tarek Boutkedjirt and Redouane Drai and Jean-Marc Girault},
year = {2018},
doi = {10.1007/978-3-030-13469-3_27},
url = {https://doi.org/10.1007/978-3-030-13469-3_27},
researchr = {https://researchr.org/publication/HouhatMBDG18},
cites = {0},
citedby = {0},
pages = {229-236},
booktitle = {Progress in Pattern Recognition, Image Analysis, Computer Vision, and Applications - 23rd Iberoamerican Congress, CIARP 2018, Madrid, Spain, November 19-22, 2018, Proceedings},
editor = {Rubén Vera-Rodríguez and Julian Fiérrez and Aythami Morales},
volume = {11401},
series = {Lecture Notes in Computer Science},
publisher = {Springer},
isbn = {978-3-030-13469-3},
}