Nesrine Houhat, Sébastien Ménigot, Tarek Boutkedjirt, Redouane Drai, Jean-Marc Girault. Optimal Stochastic Excitation for Linear Flaw Detection in a Solid Material. In Rubén Vera-Rodríguez, Julian Fiérrez, Aythami Morales, editors, Progress in Pattern Recognition, Image Analysis, Computer Vision, and Applications - 23rd Iberoamerican Congress, CIARP 2018, Madrid, Spain, November 19-22, 2018, Proceedings. Volume 11401 of Lecture Notes in Computer Science, pages 229-236, Springer, 2018. [doi]
Abstract is missing.