Measuring I/O workload characteristics in IBM/MVS systems

Gilbert E. Houtekamer. Measuring I/O workload characteristics in IBM/MVS systems. In David Morley, Jason G. Shane, Sue Felix, Bernard Domanski, John Boelens, Gordon R. Stauffer, Roberta S. Terkowitz, Tom Scoumperdis, H. Pat Artis, editors, Twelfth International Computer Measurement Group Conference, Las Vegas, NV, USA, December 8-12, 1986, Proceedings. pages 307-315, Computer Measurement Group, 1986.

Abstract

Abstract is missing.