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Yu-Ying Hsiao, Chao-Hsun Chen, Cheng-Wen Wu. A Built-In Self-Repair Scheme for NOR-Type Flash Memory. In 24th IEEE VLSI Test Symposium (VTS 2006), 30 April - 4 May 2006, Berkeley, California, USA. pages 114-119, IEEE Computer Society, 2006. [doi]