Yu-Ying Hsiao, Chao-Hsun Chen, Cheng-Wen Wu. A Built-In Self-Repair Scheme for NOR-Type Flash Memory. In 24th IEEE VLSI Test Symposium (VTS 2006), 30 April - 4 May 2006, Berkeley, California, USA. pages 114-119, IEEE Computer Society, 2006. [doi]
@inproceedings{HsiaoCW06,
title = {A Built-In Self-Repair Scheme for NOR-Type Flash Memory},
author = {Yu-Ying Hsiao and Chao-Hsun Chen and Cheng-Wen Wu},
year = {2006},
doi = {10.1109/VTS.2006.5},
url = {http://doi.ieeecomputersociety.org/10.1109/VTS.2006.5},
researchr = {https://researchr.org/publication/HsiaoCW06},
cites = {0},
citedby = {0},
pages = {114-119},
booktitle = {24th IEEE VLSI Test Symposium (VTS 2006), 30 April - 4 May 2006, Berkeley, California, USA},
publisher = {IEEE Computer Society},
isbn = {0-7695-2514-8},
}