ESD protection design for Giga-Hz high-speed I/O interfaces in a 130-nm CMOS process - researchr publication authors

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Yuan-Wen Hsiao, Ming-Dou Ker, Po-Yen Chiu, Chun Huang, Yuh-Kuang Tseng. ESD protection design for Giga-Hz high-speed I/O interfaces in a 130-nm CMOS process. In 2007 IEEE International SOC Conference, Tampere, Finland, November 19-21, 2007. pages 277-280, IEEE, 2007. [doi]

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