Dynamic state traversal for sequential circuit test generation

Michael S. Hsiao, Elizabeth M. Rudnick, Janak H. Patel. Dynamic state traversal for sequential circuit test generation. ACM Trans. Design Autom. Electr. Syst., 5(3):548-565, 2000. [doi]

Authors

Michael S. Hsiao

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Elizabeth M. Rudnick

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Janak H. Patel

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