Michael S. Hsiao, Elizabeth M. Rudnick, Janak H. Patel. Dynamic state traversal for sequential circuit test generation. ACM Trans. Design Autom. Electr. Syst., 5(3):548-565, 2000. [doi]
@article{HsiaoRP00,
title = {Dynamic state traversal for sequential circuit test generation},
author = {Michael S. Hsiao and Elizabeth M. Rudnick and Janak H. Patel},
year = {2000},
doi = {10.1145/348019.348288},
url = {http://doi.acm.org/10.1145/348019.348288},
tags = {traversal, testing},
researchr = {https://researchr.org/publication/HsiaoRP00},
cites = {0},
citedby = {0},
journal = {ACM Trans. Design Autom. Electr. Syst.},
volume = {5},
number = {3},
pages = {548-565},
}