Peter Hsieh. IoT evolution - By crossing application domains. In VLSI Design, Automation and Test, VLSI-DAT 2015, Hsinchu, Taiwan, April 27-29, 2015. pages 1, IEEE, 2015. [doi]
@inproceedings{Hsieh15-3, title = {IoT evolution - By crossing application domains}, author = {Peter Hsieh}, year = {2015}, doi = {10.1109/VLSI-DAT.2015.7114554}, url = {http://dx.doi.org/10.1109/VLSI-DAT.2015.7114554}, researchr = {https://researchr.org/publication/Hsieh15-3}, cites = {0}, citedby = {0}, pages = {1}, booktitle = {VLSI Design, Automation and Test, VLSI-DAT 2015, Hsinchu, Taiwan, April 27-29, 2015}, publisher = {IEEE}, isbn = {978-1-4799-6275-4}, }