Tong-Yu Hsieh, Chao-Ru Chen. A No-Reference Error-Tolerability Test Methodology for Image Processing Applications. In IEEE International Test Conference in Asia, ITC-Asia 2018, Harbin, China, August 15-17, 2018. pages 133-138, IEEE, 2018. [doi]
@inproceedings{HsiehC18-7,
title = {A No-Reference Error-Tolerability Test Methodology for Image Processing Applications},
author = {Tong-Yu Hsieh and Chao-Ru Chen},
year = {2018},
doi = {10.1109/ITC-Asia.2018.00033},
url = {https://doi.org/10.1109/ITC-Asia.2018.00033},
researchr = {https://researchr.org/publication/HsiehC18-7},
cites = {0},
citedby = {0},
pages = {133-138},
booktitle = {IEEE International Test Conference in Asia, ITC-Asia 2018, Harbin, China, August 15-17, 2018},
publisher = {IEEE},
isbn = {978-1-5386-5180-3},
}