Jun-Wei Hsieh, Sin-Yu Chen, Chao-Hong Chiang. Abnormal Event Analysis Using Patching Matching and Concentric Features. In Juan D. Velásquez, Sebastián A. RÃos, Robert J. Howlett, Lakhmi C. Jain, editors, Knowledge-Based and Intelligent Information and Engineering Systems, 13th International Conference, KES 2009, Santiago, Chile, September 28-30, 2009, Proceedings, Part II. Volume 5712 of Lecture Notes in Computer Science, pages 411-420, Springer, 2009. [doi]
@inproceedings{HsiehCC09,
title = {Abnormal Event Analysis Using Patching Matching and Concentric Features},
author = {Jun-Wei Hsieh and Sin-Yu Chen and Chao-Hong Chiang},
year = {2009},
doi = {10.1007/978-3-642-04592-9_52},
url = {http://dx.doi.org/10.1007/978-3-642-04592-9_52},
tags = {analysis},
researchr = {https://researchr.org/publication/HsiehCC09},
cites = {0},
citedby = {0},
pages = {411-420},
booktitle = {Knowledge-Based and Intelligent Information and Engineering Systems, 13th International Conference, KES 2009, Santiago, Chile, September 28-30, 2009, Proceedings, Part II},
editor = {Juan D. Velásquez and Sebastián A. RÃos and Robert J. Howlett and Lakhmi C. Jain},
volume = {5712},
series = {Lecture Notes in Computer Science},
publisher = {Springer},
isbn = {978-3-642-04591-2},
}