Jun-Wei Hsieh, Sin-Yu Chen, Chao-Hong Chiang. Abnormal Event Analysis Using Patching Matching and Concentric Features. In Juan D. Velásquez, Sebastián A. RÃos, Robert J. Howlett, Lakhmi C. Jain, editors, Knowledge-Based and Intelligent Information and Engineering Systems, 13th International Conference, KES 2009, Santiago, Chile, September 28-30, 2009, Proceedings, Part II. Volume 5712 of Lecture Notes in Computer Science, pages 411-420, Springer, 2009. [doi]
Abstract is missing.