Yao-Sheng Hsieh, Fan-Tien Cheng, Haw Ching Yang. Virtual-metrology-based FDC scheme. In 2012 IEEE International Conference on Automation Science and Engineering, CASE 2012, Seoul, Korea (South), August 20-24, 2012. pages 80-85, IEEE, 2012. [doi]
@inproceedings{HsiehCY12,
title = {Virtual-metrology-based FDC scheme},
author = {Yao-Sheng Hsieh and Fan-Tien Cheng and Haw Ching Yang},
year = {2012},
doi = {10.1109/CoASE.2012.6386371},
url = {http://dx.doi.org/10.1109/CoASE.2012.6386371},
researchr = {https://researchr.org/publication/HsiehCY12},
cites = {0},
citedby = {0},
pages = {80-85},
booktitle = {2012 IEEE International Conference on Automation Science and Engineering, CASE 2012, Seoul, Korea (South), August 20-24, 2012},
publisher = {IEEE},
isbn = {978-1-4673-0429-0},
}