Tong-Yu Hsieh, Kuen-Jong Lee, Melvin A. Breuer. An Error-Oriented Test Methodology to Improve Yield with Error-Tolerance. In 24th IEEE VLSI Test Symposium (VTS 2006), 30 April - 4 May 2006, Berkeley, California, USA. pages 130-135, IEEE Computer Society, 2006. [doi]
@inproceedings{HsiehLB06,
title = {An Error-Oriented Test Methodology to Improve Yield with Error-Tolerance},
author = {Tong-Yu Hsieh and Kuen-Jong Lee and Melvin A. Breuer},
year = {2006},
doi = {10.1109/VTS.2006.18},
url = {http://doi.ieeecomputersociety.org/10.1109/VTS.2006.18},
tags = {testing},
researchr = {https://researchr.org/publication/HsiehLB06},
cites = {0},
citedby = {0},
pages = {130-135},
booktitle = {24th IEEE VLSI Test Symposium (VTS 2006), 30 April - 4 May 2006, Berkeley, California, USA},
publisher = {IEEE Computer Society},
isbn = {0-7695-2514-8},
}