An Error Rate Based Test Methodology to Support Error-Tolerance

Tong-Yu Hsieh, Kuen-Jong Lee, Melvin A. Breuer. An Error Rate Based Test Methodology to Support Error-Tolerance. IEEE Transactions on Reliability, 57(1):204-214, 2008. [doi]

Authors

Tong-Yu Hsieh

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Kuen-Jong Lee

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Melvin A. Breuer

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