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Tong-Yu Hsieh, Kuen-Jong Lee, Melvin A. Breuer. An Error Rate Based Test Methodology to Support Error-Tolerance. IEEE Transactions on Reliability, 57(1):204-214, 2008. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: A novel test methodology based on error-rate to support error-toleranceKuen-Jong Lee, Tong-Yu Hsieh, Melvin A. Breuer. itc 2005: 9 [doi] An Error-Tolerance-Based Test Methodology to Support Product Grading for Yield EnhancementTong-Yu Hsieh, Kuen-Jong Lee, M. A. Breuer. tcad, 30(6):930-934, 2011. [doi]
The following publications are possibly variants of this publication: