Wen-Wen Hsieh, I-Sheng Lin, TingTing Hwang. A physical-location-aware X-filling method for IR-drop reduction in at-speed scan test. In Design, Automation and Test in Europe, DATE 2009, Nice, France, April 20-24, 2009. pages 1234-1237, IEEE, 2009. [doi]
@inproceedings{HsiehLH09-0,
title = {A physical-location-aware X-filling method for IR-drop reduction in at-speed scan test},
author = {Wen-Wen Hsieh and I-Sheng Lin and TingTing Hwang},
year = {2009},
url = {http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=5090609&arnumber=5090852&count=326&index=238},
tags = {testing, context-aware},
researchr = {https://researchr.org/publication/HsiehLH09-0},
cites = {0},
citedby = {0},
pages = {1234-1237},
booktitle = {Design, Automation and Test in Europe, DATE 2009, Nice, France, April 20-24, 2009},
publisher = {IEEE},
}