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Reliability evaluation and redesign methodology for RFCMOS transceiver frontend circuits in sub-6-GHz band of fifth-generation new radio communication based on the reliability model

Chun-Ting Hsieh, Shang-Hsien Wang, Chun-Wei Yeh, Wei-Cheng Lin. Reliability evaluation and redesign methodology for RFCMOS transceiver frontend circuits in sub-6-GHz band of fifth-generation new radio communication based on the reliability model. I. J. Circuit Theory and Applications, 49(10):3443-3454, 2021. [doi]

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