Chun-Lung Hsu. Control and Observation Structure for Analog Circuits with Current Test Data. J. Electronic Testing, 20(1):39-44, 2004. [doi]
@article{Hsu04:2,
title = {Control and Observation Structure for Analog Circuits with Current Test Data},
author = {Chun-Lung Hsu},
year = {2004},
doi = {10.1023/B:JETT.0000009312.02003.04},
url = {http://dx.doi.org/10.1023/B:JETT.0000009312.02003.04},
tags = {testing, data-flow},
researchr = {https://researchr.org/publication/Hsu04%3A2},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {20},
number = {1},
pages = {39-44},
}