Virtual metrology of material removal rate using a one-dimensional convolutional neural network-based bidirectional long short-term memory network with attention - researchr publication

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Chia-Yu Hsu, Yi-Wei Lu. Virtual metrology of material removal rate using a one-dimensional convolutional neural network-based bidirectional long short-term memory network with attention. Computers & Industrial Engineering, 186:109701, December 2023. [doi]

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