Built-in self-test for phase-locked loops

Chun-Lung Hsu, Yi-Ting Lai, Shu-Wei Wang. Built-in self-test for phase-locked loops. IEEE T. Instrumentation and Measurement, 54(3):996-1002, 2005. [doi]

Authors

Chun-Lung Hsu

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Yi-Ting Lai

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Shu-Wei Wang

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