Chun-Lung Hsu, Yi-Ting Lai, Shu-Wei Wang. Built-in self-test for phase-locked loops. IEEE T. Instrumentation and Measurement, 54(3):996-1002, 2005. [doi]
@article{HsuLW05,
title = {Built-in self-test for phase-locked loops},
author = {Chun-Lung Hsu and Yi-Ting Lai and Shu-Wei Wang},
year = {2005},
doi = {10.1109/TIM.2005.847343},
url = {http://dx.doi.org/10.1109/TIM.2005.847343},
tags = {testing},
researchr = {https://researchr.org/publication/HsuLW05},
cites = {0},
citedby = {0},
journal = {IEEE T. Instrumentation and Measurement},
volume = {54},
number = {3},
pages = {996-1002},
}