A pattern compaction technique for power estimation based on power sensitivity information

Chih-Yang Hsu, Chaur-Wen Wei, Wen-Zen Shen. A pattern compaction technique for power estimation based on power sensitivity information. In International Symposium on Circuits and Systems (ISCAS 2001), 6-9 May 2001, Sydney, Australia. pages 467-470, IEEE, 2001. [doi]

Authors

Chih-Yang Hsu

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Chaur-Wen Wei

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Wen-Zen Shen

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