A pattern compaction technique for power estimation based on power sensitivity information

Chih-Yang Hsu, Chaur-Wen Wei, Wen-Zen Shen. A pattern compaction technique for power estimation based on power sensitivity information. In International Symposium on Circuits and Systems (ISCAS 2001), 6-9 May 2001, Sydney, Australia. pages 467-470, IEEE, 2001. [doi]

@inproceedings{HsuWS01,
  title = {A pattern compaction technique for power estimation based on power sensitivity information},
  author = {Chih-Yang Hsu and Chaur-Wen Wei and Wen-Zen Shen},
  year = {2001},
  doi = {10.1109/ISCAS.2001.922086},
  url = {http://doi.ieeecomputersociety.org/10.1109/ISCAS.2001.922086},
  tags = {rule-based},
  researchr = {https://researchr.org/publication/HsuWS01},
  cites = {0},
  citedby = {0},
  pages = {467-470},
  booktitle = {International Symposium on Circuits and Systems (ISCAS 2001), 6-9 May 2001, Sydney, Australia},
  publisher = {IEEE},
  isbn = {0-7803-6685-9},
}