Chien-Hsin Hsueh, Yung-Pin Cheng, Wei-Cheng Pan. Intrusive Test Automation with Failed Test Case Clustering. In Tran Dan Thu, Karl R. P. H. Leung, editors, 2011 18th Asia Pacific Software Engineering Conference, Ho Chi Minh, Vietnam, December 5-8, 2011. pages 89-96, IEEE, 2011. [doi]
@inproceedings{HsuehCP11,
title = {Intrusive Test Automation with Failed Test Case Clustering},
author = {Chien-Hsin Hsueh and Yung-Pin Cheng and Wei-Cheng Pan},
year = {2011},
doi = {10.1109/APSEC.2011.31},
url = {http://doi.ieeecomputersociety.org/10.1109/APSEC.2011.31},
researchr = {https://researchr.org/publication/HsuehCP11},
cites = {0},
citedby = {0},
pages = {89-96},
booktitle = {2011 18th Asia Pacific Software Engineering Conference, Ho Chi Minh, Vietnam, December 5-8, 2011},
editor = {Tran Dan Thu and Karl R. P. H. Leung},
publisher = {IEEE},
isbn = {978-1-4577-2199-1},
}