Chien-Hsin Hsueh, Yung-Pin Cheng, Wei-Cheng Pan. Intrusive Test Automation with Failed Test Case Clustering. In Tran Dan Thu, Karl R. P. H. Leung, editors, 2011 18th Asia Pacific Software Engineering Conference, Ho Chi Minh, Vietnam, December 5-8, 2011. pages 89-96, IEEE, 2011. [doi]
Abstract is missing.