Test Directive Generation for Functional Coverage Closure Using Inductive Logic Programming

Hsiou-Wen Hsueh, Kerstin Eder. Test Directive Generation for Functional Coverage Closure Using Inductive Logic Programming. In Eleventh Annual IEEE International High-Level Design Validation and Test Workshop 2006, Monterey, CA, USA, Nov 9-10, 2006. pages 11-18, IEEE Computer Society, 2006. [doi]

Abstract

Abstract is missing.