Kelvin K. Hsueh, Sin-Hao Ke, Jeffrey Lee, Elyse Rosenbaum. UVeriESD: An ESD verification tool for SoC design. In IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2008, Macao, China, November 30 2008 - December 3, 2008. pages 53-56, IEEE, 2008. [doi]
@inproceedings{HsuehKLR08, title = {UVeriESD: An ESD verification tool for SoC design}, author = {Kelvin K. Hsueh and Sin-Hao Ke and Jeffrey Lee and Elyse Rosenbaum}, year = {2008}, doi = {10.1109/APCCAS.2008.4745958}, url = {http://dx.doi.org/10.1109/APCCAS.2008.4745958}, researchr = {https://researchr.org/publication/HsuehKLR08}, cites = {0}, citedby = {0}, pages = {53-56}, booktitle = {IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2008, Macao, China, November 30 2008 - December 3, 2008}, publisher = {IEEE}, }