On optical phase shift profilometry based on dual tree complex wavelet transform - researchr publication authors

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Tai-Chiu Hsung, Daniel Pak-Kong Lun. On optical phase shift profilometry based on dual tree complex wavelet transform. In Proceedings of the International Conference on Image Processing, ICIP 2010, September 26-29, Hong Kong, China. pages 337-340, IEEE, 2010. [doi]

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