Tai-Chiu Hsung, Daniel Pak-Kong Lun. On optical phase shift profilometry based on dual tree complex wavelet transform. In Proceedings of the International Conference on Image Processing, ICIP 2010, September 26-29, Hong Kong, China. pages 337-340, IEEE, 2010. [doi]
@inproceedings{HsungL10,
title = {On optical phase shift profilometry based on dual tree complex wavelet transform},
author = {Tai-Chiu Hsung and Daniel Pak-Kong Lun},
year = {2010},
doi = {10.1109/ICIP.2010.5653341},
url = {http://dx.doi.org/10.1109/ICIP.2010.5653341},
tags = {rule-based},
researchr = {https://researchr.org/publication/HsungL10},
cites = {0},
citedby = {0},
pages = {337-340},
booktitle = {Proceedings of the International Conference on Image Processing, ICIP 2010, September 26-29, Hong Kong, China},
publisher = {IEEE},
isbn = {978-1-4244-7994-8},
}