Zhifu Hu, Xuebang Gao, Shujun Cai. Electro-thermal model extraction of power GaN HEMT using I-V pulsed and DC measurements. In 2011 IEEE 9th International Conference on ASIC, ASICON 2011, Xiamen, China, October 25-28, 2011. pages 850-853, IEEE, 2011. [doi]
Abstract is missing.