Xuan Hu, Jie Liu. Orthogonal Defect Classification-based Ontology Construction and Application of Software-hardware Integrated Error Pattern of Software-intensive Systems. In 24th International Conference on Advanced Communication Technology, ICACT 2022, Pyeongchang, Korea, February 13-16, 2022. pages 1286-1298, IEEE, 2022. [doi]
@inproceedings{HuL22a,
title = {Orthogonal Defect Classification-based Ontology Construction and Application of Software-hardware Integrated Error Pattern of Software-intensive Systems},
author = {Xuan Hu and Jie Liu},
year = {2022},
doi = {10.23919/ICACT53585.2022.9728927},
url = {https://doi.org/10.23919/ICACT53585.2022.9728927},
researchr = {https://researchr.org/publication/HuL22a},
cites = {0},
citedby = {0},
pages = {1286-1298},
booktitle = {24th International Conference on Advanced Communication Technology, ICACT 2022, Pyeongchang, Korea, February 13-16, 2022},
publisher = {IEEE},
isbn = {979-11-88428-08-3},
}