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Orthogonal Defect Classification-based Ontology Construction and Application of Software-hardware Integrated Error Pattern of Software-intensive Systems

Xuan Hu, Jie Liu. Orthogonal Defect Classification-based Ontology Construction and Application of Software-hardware Integrated Error Pattern of Software-intensive Systems. In 24th International Conference on Advanced Communication Technology, ICACT 2022, Pyeongchang, Korea, February 13-16, 2022. pages 1286-1298, IEEE, 2022. [doi]

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