Yu Hu, Xiaowei Li, Huawei Li, Xiaoqing Wen. Compression/Scan Co-Design for Reducing Test Data Volume, Scan-in Power Dissipation and Test Application Time. In 11th IEEE Pacific Rim International Symposium on Dependable Computing (PRDC 2005), 12-14 December, 2005, Changsha, Hunan, China. pages 175-182, IEEE Computer Society, 2005. [doi]
@inproceedings{HuLLW05,
title = {Compression/Scan Co-Design for Reducing Test Data Volume, Scan-in Power Dissipation and Test Application Time},
author = {Yu Hu and Xiaowei Li and Huawei Li and Xiaoqing Wen},
year = {2005},
doi = {10.1109/PRDC.2005.26},
url = {http://doi.ieeecomputersociety.org/10.1109/PRDC.2005.26},
tags = {testing, design},
researchr = {https://researchr.org/publication/HuLLW05},
cites = {0},
citedby = {0},
pages = {175-182},
booktitle = {11th IEEE Pacific Rim International Symposium on Dependable Computing (PRDC 2005), 12-14 December, 2005, Changsha, Hunan, China},
publisher = {IEEE Computer Society},
isbn = {0-7695-2492-3},
}