Yu Hu, Xiaowei Li, Huawei Li, Xiaoqing Wen. Compression/Scan Co-Design for Reducing Test Data Volume, Scan-in Power Dissipation and Test Application Time. In 11th IEEE Pacific Rim International Symposium on Dependable Computing (PRDC 2005), 12-14 December, 2005, Changsha, Hunan, China. pages 175-182, IEEE Computer Society, 2005. [doi]
Abstract is missing.