Shengdong Hu, Jun Luo, Kaizhou Tan, Ling Zhang, Zhaoji Li, Bo Zhang, Jianlin Zhou, Ping Gan, Guolin Qin, Zhengyuan Zhang. Realizing high breakdown voltage for a novel interface charges islands structure based on partial-SOI substrate. Microelectronics Reliability, 52(4):692-697, 2012. [doi]
@article{HuLTZLZZGQZ12,
title = {Realizing high breakdown voltage for a novel interface charges islands structure based on partial-SOI substrate},
author = {Shengdong Hu and Jun Luo and Kaizhou Tan and Ling Zhang and Zhaoji Li and Bo Zhang and Jianlin Zhou and Ping Gan and Guolin Qin and Zhengyuan Zhang},
year = {2012},
doi = {10.1016/j.microrel.2011.11.007},
url = {http://dx.doi.org/10.1016/j.microrel.2011.11.007},
researchr = {https://researchr.org/publication/HuLTZLZZGQZ12},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {52},
number = {4},
pages = {692-697},
}