Shengdong Hu, Jun Luo, Kaizhou Tan, Ling Zhang, Zhaoji Li, Bo Zhang, Jianlin Zhou, Ping Gan, Guolin Qin, Zhengyuan Zhang. Realizing high breakdown voltage for a novel interface charges islands structure based on partial-SOI substrate. Microelectronics Reliability, 52(4):692-697, 2012. [doi]
Abstract is missing.